Emerging Nanotechnologies: Test, Defect Tolerance, and by Mohammad Tehranipoor

By Mohammad Tehranipoor

Emerging Nanotechnologies: try, disorder Tolerance and Reliability covers a variety of applied sciences which have been constructing during the last many years akin to chemically assembled digital nanotechnology, Quantum-dot mobile Automata (QCA), and nanowires and carbon nanotubes. every one of those applied sciences bargains numerous benefits and drawbacks. a few be afflicted by excessive strength, a few paintings in very low temperatures and a few others want indeterministic bottom-up meeting. those rising applied sciences aren't regarded as an immediate alternative for CMOS expertise and will require a totally new structure to accomplish their functionality.

Emerging Nanotechnologies: try out, illness Tolerance and Reliability brings all of those matters jointly in a single position for readers and researchers who're attracted to this swiftly altering field.

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Extra info for Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing)

Example text

We assume that such long wires can be used by external circuits to access blocks along the edges. Since the number of long wires is limited, multiple configurations are needed to access each of these blocks. Our strategy relies on a set of fault detection configurations (FDCs) where different faults of the BUT can be tested. The proposed configurations can provide 100% fault coverage for any stuck-at, stuck-open, bridging, and connection faults in the nanoblocks. The details of these configurations, referred to FDC-1, are discussed in Sect.

External circuits are used as ORAs. Fig. 10. TG allocations for TG SE Overall BIST Algorithm: 1. 2. 3. 4. 5. 6. Run the BIST procedure using TG SE; Run the BIST procedure using TG E; Run the BIST procedure using TG S; Run the BIST procedure using TGs only for switchblock testing; Generate an overall defect map; Run the adaptive recovery procedure to further improve recovery. Fig. 11. Overall BIST algorithm allocations are needed, as shown in Fig. 10. A TG is represented by an arrow that starts from the TPG and ends at the ORA.

Evaluating the range of f values accounting for, say, 95% of the likelihood indicates how well our simulation determines the value. Figure 15 is an example of the behavior of implementing a 3-bit adder circuit, using the two rewrites discussed in Sect. 5: a single stage and three stages. In this and subsequent figures, each point for the 1-stage adder is the result of 50 simulation trials at the corresponding defect rate p; and each point for the 3-stage adder is from 100 trials. We see a threshold behavior as Pcircuit drops abruptly over a fairly short range of p values.

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